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Instrument Description

The shielded sample preparation area (SSPA) at the IMCL is designated for sample preparation and optical microscopy on highly radioactive materials. The SSPA consists of three shielded bays, an inert N2 glovebox, and a radiological fume hood, all connected for ease in transferring of materials. The three shielded bays focus on sample preparation, optical microscopy, and transferring of samples. The sample preparation bay has an automated grinder/polisher, a low-speed saw, and decontamination tools. The optical microscopy bay hosts a Keyence optical microscope with 1,000x capability. The transfer cell hosts radiological measurement equipment and can facilitate transfers of highly radioactive materials. The inert glovebox is focused on sample preparation activities of low-dose materials. It contains automated polishers, cameras, low-speed saws, and various other equipment that support sample preparation activities. The fume hood is used for sample preparation activities on low-dose, low-contaminated materials.



Sample preparation and optical microscopy of highly radioactive materials



Sample preparation includes highly radioactive fuels (both commercial and research based) and transuranic bearing materials. Quantities of material are limited by shielding capabilities of the IMCL transfer cask and the SSPA.

Instrument sample preparation area; Shielded optical microscopy vacuum testing chambers testing properties gross and isotopic gamma scanning; Instron remote load frame gas measurement and analysis accident condition simulator furnace extrusion; Metallic fuel line; Advanced Fuel Cycle Initiative glovebox; Glovebox advance casting system furnace; Metallic fuel line; Metallic fuel line handling; Inert-radiological gloveboxes; Uranium handling repackaging glovebox; Transuranic breakout glovebox gamma irradiator surveillance glovebox line; Cell area Quanta 3D FEG dual-beam SEM FIB JSM-7000f SEM; Gatan precision etching and coating system; Gatan precision ion polishing systems II; Gatan precision ion polishing systems JEM 2010 STEM Cameca SX100R EPMA FEI QUANTA 3D FEG Titan ChemiSTEM FEG-STEM FEI Helios dual-beam SEM-plasma FIB diffraction; Micro X-ray diffractometer Di LemmaJEOL JSM-7000f SEM coupled plasma-mass spectrometer coupled plasma-atomic emission spectrometer; Thermal Ionization Mass Spectrometer coupled plasma-mass spectrometer advance casting system furnace; Hot uniaxial press furnace mass spectrometer; ELTRA CS-800; ELTRA ONH-2000 furnace; Differential scanning calorimeter; Simultaneous thermal analyzer; Pushrod dilatometer; Laser flash analyzer Separator Laboratories X-ray diffractometer; X-ray diffraction; Hot uniaxial press furnace
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