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Instrument Description

The JEOL JSM-7000F is a high-resolution field emission scanning electron microscope that employs a Schottky-type field emission (T-FE) gun for the electron source. The major attachments of this instrument are: an Oxford X-Max 20 energy dispersive X-ray spectroscopy (EDS) detector, an Oxford wavelength dispersive X-ray spectroscopy (WDS) detector, and an HKL electron backscatter diffraction (EBSD) system. This scanning electron microscope has been utilized extensively for the microstructure characterization of highly radioactive materials and irradiated nuclear fuels.


  • Microstructure characterization of fresh and irradiated nuclear fuels and materials

  • Chemical composition determination and elemental mapping by EDS and WDS to understand the fuel/cladding chemical interactions and fission products distribution in irradiated nuclear fuels

  • Quality assurance and failure analysis of as-fabricated and irradiated nuclear fuels


  • Magnification: 10x to 500,000x

  • Resolution: 1.2 nm at 15 kV

  • Acceleration voltage: 0.5 to 30 kV

  • Probe current: 1 pA to 200 nA

Instrument sample preparation area; Shielded optical microscopy vacuum testing chambers testing properties gross and isotopic gamma scanning; Instron remote load frame gas measurement and analysis accident condition simulator furnace extrusion; Metallic fuel line; Advanced Fuel Cycle Initiative glovebox; Glovebox advance casting system furnace; Metallic fuel line; Metallic fuel line handling; Inert-radiological gloveboxes; Uranium handling repackaging glovebox; Transuranic breakout glovebox gamma irradiator surveillance glovebox line; Cell area Quanta 3D FEG dual-beam SEM FIB JSM-7000f SEM; Gatan precision etching and coating system; Gatan precision ion polishing systems II; Gatan precision ion polishing systems JEM 2010 STEM Cameca SX100R EPMA FEI QUANTA 3D FEG Titan ChemiSTEM FEG-STEM FEI Helios dual-beam SEM-plasma FIB diffraction; Micro X-ray diffractometer Di LemmaJEOL JSM-7000f SEM coupled plasma-mass spectrometer coupled plasma-atomic emission spectrometer; Thermal Ionization Mass Spectrometer coupled plasma-mass spectrometer advance casting system furnace; Hot uniaxial press furnace mass spectrometer; ELTRA CS-800; ELTRA ONH-2000 furnace; Differential scanning calorimeter; Simultaneous thermal analyzer; Pushrod dilatometer; Laser flash analyzer Separator Laboratories X-ray diffractometer; X-ray diffraction; Hot uniaxial press furnace
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