The JEOL JSM-7000F is a high-resolution field emission scanning electron microscope that employs a Schottky-type field emission (T-FE) gun for the electron source. The major attachments of this instrument are: an Oxford X-Max 20 energy dispersive X-ray spectroscopy (EDS) detector, an Oxford wavelength dispersive X-ray spectroscopy (WDS) detector, and an HKL electron backscatter diffraction (EBSD) system. This scanning electron microscope has been utilized extensively for the microstructure characterization of highly radioactive materials and irradiated nuclear fuels.
Microstructure characterization of fresh and irradiated nuclear fuels and materials
Chemical composition determination and elemental mapping by EDS and WDS to understand the fuel/cladding chemical interactions and fission products distribution in irradiated nuclear fuels
Quality assurance and failure analysis of as-fabricated and irradiated nuclear fuels
Magnification: 10x to 500,000x
Resolution: 1.2 nm at 15 kV
Acceleration voltage: 0.5 to 30 kV
Probe current: 1 pA to 200 nA