The JEOL JEM-2010 TEM/STEM at EML is a 200KV transmission electron microscope. It has an analytical resolution pole piece in high-contrast configuration. The TEM image is recorded on a Gatan UltraScan 1000 digital camera with 2048x2048 pixels in 16 bits over a roughly 0.8x0.8-inch image area on the large phosphorous screen. The STEM probe size is 15, 20, and 25 nm. The Bruker SDD EDS detector allows fast EDS analysis including elemental line scanning and 2-D mapping. The retractable SDD detector allows for TEM analysis of a highly radioactive sample without composition analysis. In addition to the standard double-tilt analytical holder, the TEM is equipped with a double-tilt heating holder (Gatan model: 652.MA) with maximum temperature up to 850°C.
Microstructural defects analysis for irradiated fuel and materials.
Thermal stability and phase stability studies with TEM in-situ heating experiment.
High-resolution chemical analysis (25 nm) with SDD in STEM mode.
Magnification: 1,000x to 800,000x
Resolution: 0.23 nm at 200 kV
Acceleration voltage: 80 to 200 kV