PIPS is a user-friendly precision ion polisher designed to produce high-quality, transmission electron microscope specimens with minimal effort.
TEM sample final polishing after dimple grinding or jet polishing
Repair of thick region from the jet-polished samples
Removal of TEM sample surface contaminants or oxide layers
Ion milling at beam incident angle of ± 10 degree. Each gun is independently adjustable.
Ion beam energy: 1.5 keV to 6.0 keV.
Ion current density: 10 mA/cm2 at Peak .
Ion beam diameter: 350 µ FWHM at 5 keV to 800 µ FWHM at 5 keV broad beam guns.
Sample size: 3 mm or 2.3 mm.
Sample rotation: variable from 1 to 6 rpm.
Chamber vacuum: 5E-6 torr base pressure, 8E-5 torr operating pressure.