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POST-IRRADIATION EXAMINATION

 

EML.png

The Electron Microscopy Laboratory (EML) is a user facility dedicated to materials characterization, using primarily electron and optical microscopy tools. Sample preparation capabilities for radioactive materials ensure that high-quality samples are available for characterization.



Basic Capabilities:

  • Scanning electron microscopy (SEM) with microchemical analysis and grain-orientation imaging

  • Dual-beam focused ion beam (FIB) with microchemical analysis and orientation imaging

  • Transmission electron microscopy (TEM) with microchemical analysis

  • Optical microscopy

  • Microhardness testing

  • Precision ion polishing and coating systems

  • Sample preparation of irradiated metals, ceramics, and small quantities of irradiated fuel for examination in gloveboxes and chemical hoods

 

Instruments:

  
  
  
  
  
  
FEG FIBDual-beam focused ion beam with energy dispersive spectroscopy (EDS), wavelength dispersive spectroscopy (WDS) and electron backscatter diffraction (EBSD) detectors and omniprobe micromanipulatorElectron Microscopy Laboratoryhttps://mfctemp.inl.gov/SitePages/Electron%20Microscopy%20Laboratory/FEI%20Quanta%203G%20Field%20Emission%20Gun.aspx
  
Electron Microscopy Laboratoryhttps://mfctemp.inl.gov/SitePages/Electron%20Microscopy%20Laboratory/JEOL%20JSM-7000f%20SEM%20with%20EDS,%20WDS%20and%20EBSD%20detectors.aspx
  
Electron Microscopy Laboratoryhttps://mfctemp.inl.gov/SitePages/Electron%20Microscopy%20Laboratory/JEOL%20JEM%202010%20STEM.aspx
  
PIPS-2Electron Microscopy Laboratoryhttps://mfctemp.inl.gov/SitePages/Electron%20Microscopy%20Laboratory/Gatan%20precision%20ion%20polishing%20systems.aspx
  
PECSElectron Microscopy Laboratoryhttps://mfctemp.inl.gov/SitePages/Electron%20Microscopy%20Laboratory/Gatan%20precision%20etching%20and%20coating%20system.aspx
  
PIPS-IIElectron Microscopy LaboratoryPIPS-II

 

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